For the study of two-dimensional systems with repulsive or oscillatory interactions, his group developed LEED-diffractometry that allows the determination of critical exponents in chemisorbed layers with accuracy comparable to that achieved with x-rays in physisorbed layers.
1976 Rigaku developed the first parallel-beam type X-ray diffractometer for stress analysis, as well as the first X-ray fluorescence spectrometers capable of carbon analysis (1976) and boron analysis (1981).