However, practical design and construction of scanning confocal electron microscope is a complex problem first solved by Nestor J. Zaluzec.
electron | Acorn Electron | Visa Electron | Transmission electron microscopy | confocal microscopy | microscopy | electron transport chain | Electron microscope | electron beam | Scanning transmission electron microscopy | Microscopy | Low-energy electron diffraction | Electron paramagnetic resonance | electron microscopy | electron microscope | Electron configuration | Electron | Confocal microscopy | Bright-field microscopy | Atomic force microscopy | atomic force microscopy | Transmission Electron Microscopy (TEM) | Transmission Electron Microscopy | transmission electron microscopy | Three-center two-electron bond | three-center two-electron bond | Three-center four-electron bond | Serial Block-Face Scanning Electron Microscopy | Scanning tunneling microscope | scanning tunneling microscope |